By Kirk A. Gray,John J. Paschkewitz
Next iteration HALT and HASS provides an immense paradigm shift from reliability prediction-based how to discovery of digital platforms reliability hazards. this can be accomplished by means of integrating hugely sped up existence attempt (HALT) and hugely speeded up pressure monitor (HASS) right into a physics-of-failure-based strong product and method improvement methodology. The new methodologies problem deceptive and infrequently expensive mis-application of probabilistic failure prediction equipment (FPM) and supply a brand new deterministic map for reliability improvement. The authors basically clarify the hot strategy with a logical development of challenge assertion and solutions.
The ebook is helping engineers hire HALT and HASS by means of illustrating why the deceptive assumptions used for FPM are invalid. subsequent, the applying of HALT and HASS empirical discovery how to quick locate unreliable components in electronics platforms offers readers sensible perception to the techniques.
The physics of HALT and HASS methodologies are highlighted, illustrating how they discover and isolate software program mess ups as a result of hardware-software interactions in electronic systems. using empirical operational tension limits for the advance of destiny instruments and reliability discriminators is described.
* presents a transparent foundation for relocating from statistical reliability prediction types to sensible equipment of insuring and bettering reliability.
* demanding situations current failure prediction methodologies by way of highlighting their boundaries utilizing genuine box data.
* Explains a realistic method of why and the way HALT and HASS are utilized to electronics and electromechanical systems.
* offers possibilities to enhance reliability try discriminators for prognostics utilizing empirical rigidity limits.
* courses engineers and bosses at the merits of the deterministic and extra effective tools of HALT and HASS.
* Integrates the empirical restrict discovery tools of HALT and HASS right into a physics of failure dependent strong product and method improvement process.
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Extra resources for Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Engineering Series)
Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Engineering Series) by Kirk A. Gray,John J. Paschkewitz